MIT.nano expanded its characterization capabilities by integrating the Bruker D8 Discover Plus XRD instrument, featuring a high-brilliance micro-focus copper X-ray source and a large area detector. This instrument excels at probing small thin film areas, enabling nondestructive examination of crystalline phases, grain size, orientation, and defects at atomic scales.
Positioned within the Characterization.nano X-ray diffraction and imaging shared facility, the system supports a broad range of materials research, including electronics, energy storage, healthcare, and nanotechnology. While vendor details highlight its performance for phase identification and microstructural analysis, independent verification remains pending, underscoring its potential to advance material insights.
Source & further reading
Exploring materials at the atomic scale ↗Source published 2026-02-20. This report was prepared with AI assistance from the linked primary-source material. Claims and limitations should be checked against the original announcement or research.